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Test Equipment


AMS 3000


Product Details

Specifications


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AMS 3000

SPECIFICATIONS
Control Computer

 

Workstation Sun SparcStation
19in , 1152 x 900 pixel
color display


Software

 

Operating system UNIX
Mechanical probes MPC tool
Layout formats GDSII stream , CIF, APPLE 860
Invisible features
location tools
Layout Overlay
Large Area Overlay
Image Overlay


Specimen Chamber and Column Stage

 

Column stage movement 50 x 50 mm
Blind navigation error ± 0.2 microns over 500 micron area
Specimen stage IDS packaged part load modules
Precision 80mm specimen tilt stage
Tilt 0 - 55 degrees tilt (optional)
Tilt tracking Software eucentric


Mechanical Probes in Chamber

 

Number of probes Up to 3 independent stages. Standard
configuration includes 1 stage.
Passive and active probes available in
any combination.
Probe movement 25mm  (X,Y)
10mm  Z
Stage resolution Coarse mode  0.4 microns
Fine mode  0.02 microns
Probe types GGB picoprobe 7A standard passive
probe 7,12C, 34A (optional)
(SMA connectors)
Tip radius all types >0.2 microns


Beam and Gas Parameters

 

Ion source LMIS with 2-lens focusing column
Beam currents Electronic infinitely variable aperture
5pA-6nA
Beam energy 5KeV to 30KeV
Deposition material Conductor and insulator
Halogen gases Metal and dielectric preferential


Imaging

 

Maximum field of view 5mm square area
Minimum field of view 1 micron square area


Power Requirements

 

Voltage 200, 208, 220, 240 Volts
AC single phase
Current 30 A
Frequency 50Hz or 60Hz

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