Schlumberger
Automated
Test Equipment
AMS 3000
Product Details
Specifications
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AMS 3000
 All-in-one solution for waveform measurement for analog
mixed-signal devices and probe point creation
Reduces debug cycle time for small geometry mixed-signal
devices
FIB microscope with mechanical probes in chamber
The FIB microscope is the ideal tool to manipulate mechanical probes as both probe and device surface are simultaneously in focus
| Features |
Benefits |
| High resolution imaging |
Speeds navigation and probe point placement |
| FIB microscope with large depth of focus |
Increases probe manipulation accuracy and reduces risk of damage to sample probes and devices during touch downs |
| Large working distance |
Easily supports a variety of package types |
| Up to 3 probes in the chamber |
Can achieve the most complex requirements for mixed-signal probing |
Mechanical Probe is No Longer Difficult to Use
- IDS graphical user interface
- Easy probe manipulation
- IDS CAD navigation software (IDS 5000ZX, IDS 10000, and IDS 10000plus compatible)
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