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AMS 3000
The Analog & Mixed-Signal Probe System
The AMS 3000 is the premier tool for IC debug and repair of advanced analog and mixed-signal devices. By integrating mechanical probes in the vacuum chamber, the AMS 3000 is the only system to allow probe-point creation for multiple layer processes and analog waveform measurement within one single system. Compared to traditional optical microscopes with mechanical probes, the AMS 3000 delivers significantly better spatial resolution, a larger depth of focus for ease-of-use and a greater working distance to accommodate deep cavities on complex packages.
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