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Schlumberger Diagnostic Systems Analog & Mixed Signal Design Debug |
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Diagnostic Systems
Timing analysis and analog and mixed-signal device debug systems enjoy an overwhelming presence in the global semiconductor diagnostic market, utilizing electron beam technology and focused ion beam technology for design debug, repair and failure analysis applications. A unique user interface and navigational software shared by all diagnostic systems allows faults to be identified on one system and repaired or cross- sectioned on another in a fraction of the time required for previous-generation diagnostic equipment. Verification Systems, a unit of Schlumberger, has set the technology standard for submicron measuring excellence. Our growing installed base of state-of-the-art automatic Overlay Registrations and Critical Dimension Scanning Electron Microscope measurement systems is at work in leading semiconductor and thin-film head manufacturing facilities worldwide. |
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